Keithley’s industry-leading Model 4200-SCS Semiconductor Characterization System is now available with pulse generation and measurement. Please complete the information below and click "Contiune" to view a short, on-line product presentation and find out how this new PIV (Pulse I-V) Package enables superior measurements and faster time-to-market for leading-edge researchers, engineers, and designers working with high-k materials, thermally sensitive devices, and advanced memory chips.

Find out how the industry’s leading semiconductor characterization system just got even better – and is now uniquely capable of meeting the advanced characterization needs for leading-edge semiconductor technologies.

Click here to view a short on-line product presentation.