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- Bitte auswählen
- Puls-Testlösungen
- Integrierte Systeme auf der Basis von Messgeräten
- Zuverlässigkeitstest
- Parametrische Testsysteme
- Bauteilcharakterisierungssysteme
- Messstellenumschaltung für kleine Ströme
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Fordern Sie Ihr Exemplar des "Semiconductor Test Tutorial Handbook, Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing" von Keithley an.
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- Puls-Testlösungen
- Model 4205-PG2 Dual-Channel Pulse Generator
- Model 4200-PIV-A Pulse I-V Option for the Model 4200-SCS (includes Models 4200-PG2 and 4200-SCP2, Software, and Specialized Interconnect Hardware)
- Model 4200-PIV-Q Pulse I-V with Q Point and Dual Channel Pulsing
- Model 4200-FLASH Non-Volatile Memory Test Option
- Integrierte Systeme auf der Basis von Messgeräten
- Model ACS Basic Edition Automated Characterization Suite for Component Characterization
- Automated Characterization Suite (ACS) Test Systems
- ACS for Wafer Level Reliability (WLR)
- Zuverlässigkeitstest
- Automated Characterization Suite (ACS) Test Systems
- ACS for Wafer Level Reliability (WLR)
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 2612A Dual-channel System SourceMeter Instrument (200V, 10A Pulse)
- Parametrische Testsysteme
- Series S530 Parametric Test Systems
- Bauteilcharakterisierungssysteme
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 4225-PMU Ultra-Fast I-V Module
- Model 4220-PGU Pulse Generator Unit (Voltage-Source only)
- Model 4225-RPM Remote Amplifier/Switch
- Model 4200-BTI-A Ultra-Fast NBTI/PBTI Package for the Model 4200-SCS
- Model 4200-SMU Medium Power Source-Measure Unit for 4200-SCS (100mA to 100fA, 200V to 1uV, 2 Watt)
- Model 4210-SMU High Power Source-Measure Unit for 4200-SCS (1A to 100fA, 200V to 1uV, 20 Watt)
- Model 4200-PA Remote PreAmp Option for 4200-SMU and 4210-SMU
- Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit
- Model 4200-SCP2 Dual-Channel Oscilloscope Card
- Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
- Model ACS Basic Edition Automated Characterization Suite for Component Characterization
- Automated Characterization Suite (ACS) Test Systems
- ACS for Wafer Level Reliability (WLR)
- Model 4200-CVU-UPGRADE 4200-CVU Card and Upgrade for Existing 4200-SCS Systems
- Model 4200-CVU-PROBER-KIT Prober Accessory Kit for 4200-CVU
- Messstellenumschaltung für kleine Ströme
- Model 707B 6-Slot, Semiconductor Switching Matrix w/ up to 576 Crosspoints - New Features and Improved Performance
- Model 708B Single-Slot, Semiconductor Switching Matrix w/ up to 96 Crosspoints - New Features and Improved Performance
- Model 707A 6-Slot, Switching Matrix w/ up to 576 Crosspoints
- Model 708A Single-Slot, Switching Matrix w/ up to 96 Crosspoints
- Model 7072 8x12 Semiconductor Matrix Card (for Models 707A and 708A)
- Model 7072-HV 8x12, High-Voltage, Semiconductor Matrix Card (for Models 707A and 708A)
- Model 7174A 8x12, Low-Current, High-Speed Matrix Card (for Models 707A and 708A)