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Demnächst stattfindende Veranstaltungen

2011 NCSLI • NCSL International 50th Anniversary Celebration
National Harbor, MD • USA
August 22-24, 2011
Website der Ausstellung

ICSCRM 2011
International Conference on Silicon Carbide and Related Materials
Cleveland, OH • Renaissance Cleveland Hotel
September 12-16, 2011
Website der Ausstellung

MRS Materials Research Society FALL
Boston, MA • USA
Nov. 28-Dec. 2, 2011
Website der Ausstellung

Computer und Peripheriegeräte

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In der Computer-Industrie herrscht ein hoher Konkurrenzdruck, für die Hersteller der unterschiedlichsten Grundgeräte und Periphere ist daher vor allem ein kostengünstiger Produktionstest mit hoher Geschwindigkeit entscheidend. Die Testlösungen von Keithley für diese Branche reichen von der Licht-Strom-Spannungs-Charakterisierung (LIV) von VCSELs für Massenspeichergeräte, bis hin zum beschleunigten Test unter erhöhter Beanspruchung und dem Burn-in von Stromversorgungen, wobei sich Testengpässe vermeiden lassen und die Kapazität der Peripheriehersteller erhöht werden kann, ohne dass die Fertigungsmöglichkeiten deutlich ausgeweitet werden müssen.

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Burn-in, Beschleunigter Stresstest
CD- / DVD-Köpfe
Flachbildschirme
GMR-Köpfe
Massen-Speichersysteme
Stromversorgung
Unterbrechungsfreie Stromversorgungen (UPS)

Model 2701 DMM, Data Acquisition, Datalogging System w/2 Slots and Ethernet Support

Model 7708 40-Ch, Diff Mux Module w/ Automatic CJC and Screw Terminals (for Models 2700, 2701, and 2750)

Dokumente

Applikationsschrift

#2260 Burn-in Testing Techniques for Switching Power Supplies

Network Primer/Programming Tutorial for the Model 2701 Ethernet-Based DMM/Data Acquisition System

White Paper

Fundamentals of HALT/HASS Testing

Instrument-Grade Data Acquisition with Ethernet Brings Precision Measurement and Control to Networks

Making AST/Burn-in Testing More Productive with Ethernet-based Instruments

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 2520 Pulsed Laser Diode Test System w/ Remote Test Head

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Model 6485 5-1/2 digit Picoammeter with 10fA Resolution

Dokumente

Applikationsschrift

#2214 High-Throughput DC Production Test of Telecommunications Laser Diode Modules

2218 Production Testing of High-Intensity Visible LEDs

#2273 VCSEL Testing with the Model 2400 SourceMeter Instrument

#2301 Measuring Laser Diode Optical Power with the Keithley Model 2500INT Integrating Sphere

#2352 Extending the Output Range of the Model 2510 TEC SourceMeter

#2402 DC Production Testing of OLED Displays

Making Pulsed Light Measurements with the Model 2520INT Integrating Sphere

Optimizing TEC PID Coefficients Automatically with the Model 2510-AT

White Paper

Combining Fiber Alignment and Device Characterization

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 4200-SCS Semiconductor Characterization System

S400 Series Parametric Test System

Dokumente

White Paper

New Test Realities for Evolving FPD Technologies

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Dokumente

Applikationsschrift

#2217 Trigger Synchronization of Multiple SourceMeter Instruments

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Model 7702 40-Ch, Diff Mux Module w/ Screw Terminals (for Models 2700, 2701, and 2750)

Dokumente

White Paper

Fundamentals of HALT/HASS Testing

Model 2700 DMM, Data Acquisition, Datalogging System w/ 2 Slots

Model 7702 40-Ch, Diff Mux Module w/ Screw Terminals (for Models 2700, 2701, and 2750)

Model 7705 40-Ch, Single-Pole Control Module (for Models 2700, 2701, and 2750)